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Characterization for N- and P-type 3C-SiC on Si (1 0 0) substrate with thermal anneal and pulsed excimer laser anneal

  • Kung Yen Lee
  • , Yu Hao Chang
  • , Yan Hao Huang
  • , Chih Fang Huang
  • , Cheng Yueh Chung
  • , Feng Zhao
  • National Taiwan University
  • National Tsing Hua University
  • Washington State University Vancouver

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)46-50
Number of pages5
JournalApplied Surface Science
Volume266
DOIs
StatePublished - Feb 1 2013
Externally publishedYes

ASJC Scopus Subject Areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Keywords

  • 3C-SiC
  • Anneal
  • FTIR
  • Pulsed excimer laser
  • Raman
  • XRD

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