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Cascading of 2D and 3D Simulations of ASIC Substrate Interconnect up to 100 GHz

  • Zhekun Peng
  • , Junyong Park
  • , Sathvika Bandi
  • , Santosh Pappu
  • , Srinivas Venkataraman
  • , Xu Wang
  • , Granthana Ranzaswamy
  • , Dong Hyun Kim
  • Missouri University of Science and Technology
  • Meta

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original languageEnglish
Title of host publication33rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350351231
DOIs
StatePublished - 2024
Event33rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2024 - Toronto, Canada
Duration: Oct 6 2024 → Oct 9 2024

Publication series

Name33rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2024

Conference

Conference33rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2024
Country/TerritoryCanada
CityToronto
Period10/6/24 → 10/9/24

ASJC Scopus Subject Areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

Keywords

  • 2D cross section analysis
  • ASIC package substrate interconnects
  • cascaded S-parameters

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