Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning

Nguyen P. Nguyen; Stephanie Lopez; Catherine L. Smith; Teresa E. Lever; Nicole L. Nichols; Filiz Bunyak

doi:10.1109/AIPR57179.2022.10092238

Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning

Nguyen P. Nguyen
, Stephanie Lopez
, Catherine L. Smith
, Teresa E. Lever
, Nicole L. Nichols
, Filiz Bunyak

University of Missouri-Columbia
University of Missouri

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665477291
DOIs	https://doi.org/10.1109/AIPR57179.2022.10092238
State	Published - 2022
Externally published	Yes
Event	2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022 - Washington, United States Duration: Oct 11 2022 → Oct 13 2022

Publication series

Name	Proceedings - Applied Imagery Pattern Recognition Workshop
Volume	2022-October
ISSN (Print)	2164-2516

Conference

Conference	2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022
Country/Territory	United States
City	Washington
Period	10/11/22 → 10/13/22

ASJC Scopus Subject Areas

General Engineering

Keywords

axon
electron microscopy
meta learning
myelin

Access to Document

10.1109/AIPR57179.2022.10092238

Cite this

Nguyen, N. P., Lopez, S., Smith, C. L., Lever, T. E., Nichols, N. L., & Bunyak, F. (2022). Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning. In 2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022 (Proceedings - Applied Imagery Pattern Recognition Workshop; Vol. 2022-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AIPR57179.2022.10092238

Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning. / Nguyen, Nguyen P.; Lopez, Stephanie; Smith, Catherine L. et al.
2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022. Institute of Electrical and Electronics Engineers Inc., 2022. (Proceedings - Applied Imagery Pattern Recognition Workshop; Vol. 2022-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Nguyen, NP, Lopez, S, Smith, CL, Lever, TE, Nichols, NL & Bunyak, F 2022, Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning. in 2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022. Proceedings - Applied Imagery Pattern Recognition Workshop, vol. 2022-October, Institute of Electrical and Electronics Engineers Inc., 2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022, Washington, United States, 10/11/22. https://doi.org/10.1109/AIPR57179.2022.10092238

Nguyen NP, Lopez S, Smith CL, Lever TE, Nichols NL, Bunyak F. Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning. In 2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022. Institute of Electrical and Electronics Engineers Inc. 2022. (Proceedings - Applied Imagery Pattern Recognition Workshop). doi: 10.1109/AIPR57179.2022.10092238

@inproceedings{f1246cb75ad54b7fa3c28ee9de7bc947,

title = "Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning",

keywords = "axon, electron microscopy, meta learning, myelin",

author = "Nguyen, \{Nguyen P.\} and Stephanie Lopez and Smith, \{Catherine L.\} and Lever, \{Teresa E.\} and Nichols, \{Nicole L.\} and Filiz Bunyak",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022 ; Conference date: 11-10-2022 Through 13-10-2022",

year = "2022",

doi = "10.1109/AIPR57179.2022.10092238",

language = "English",

series = "Proceedings - Applied Imagery Pattern Recognition Workshop",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022",

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TY - GEN

T1 - Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning

AU - Nguyen, Nguyen P.

AU - Lopez, Stephanie

AU - Smith, Catherine L.

AU - Lever, Teresa E.

AU - Nichols, Nicole L.

AU - Bunyak, Filiz

PY - 2022

Y1 - 2022

KW - axon

KW - electron microscopy

KW - meta learning

KW - myelin

UR - https://www.scopus.com/pages/publications/85153740884

UR - https://www.scopus.com/pages/publications/85153740884#tab=citedBy

U2 - 10.1109/AIPR57179.2022.10092238

DO - 10.1109/AIPR57179.2022.10092238

M3 - Conference contribution

AN - SCOPUS:85153740884

T3 - Proceedings - Applied Imagery Pattern Recognition Workshop

BT - 2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2022 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2022

Y2 - 11 October 2022 through 13 October 2022

ER -

Axon and Myelin Sheath Segmentation in Electron Microscopy Images using Meta Learning

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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Cite this