Automated Near-Field Scanning to Identify Resonances

Giorgi Muchaidze; Huang Wei; Jin Min; Shao Peng; James L. Drewniak; David Pommerenke

doi:10.1109/EMCEUROPE.2008.4786897

Automated Near-Field Scanning to Identify Resonances

Giorgi Muchaidze
, Huang Wei
, Jin Min
, Shao Peng
, James L. Drewniak
, David Pommerenke

Electrical and Computer Engineering

Missouri University of Science and Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

Original language	American English
Journal	Proceedings of the IEEE International Symposium on Electromagnetic Compatibility: EMC Europe (2008, Hamburg, Germany)
DOIs	https://doi.org/10.1109/EMCEUROPE.2008.4786897
State	Published - Sep 1 2008

Keywords

Cables
Clocks
Coupling Circuits
Data Exchanges
EMI
ESD
Electric Inverters
Electromagnetic Compatibility
Electromagnetic Interference
Electromagnetic Pulse
Electronic Systems
Electrostatic Devices
Electrostatic Discharge
File Formats
Frequency
Immunity Analysis
Immunity Testing
Integrated Circuit Noise
Near Field Scanning
Near Fields
Plastic Molds
Resonance
Scanning
Standardized Methods
System Analysis

Disciplines

Electrical and Computer Engineering

Access to Document

10.1109/EMCEUROPE.2008.4786897License: Unspecified

Automated Near-Field Scanning to Identify ResonancesFinal published version, 343 KBLicense: Unspecified

Cite this

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title = "Automated Near-Field Scanning to Identify Resonances",

abstract = " Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.",

keywords = "Cables, Clocks, Coupling Circuits, Data Exchanges, EMI, ESD, Electric Inverters, Electromagnetic Compatibility, Electromagnetic Interference, Electromagnetic Pulse, Electronic Systems, Electrostatic Devices, Electrostatic Discharge, File Formats, Frequency, Immunity Analysis, Immunity Testing, Integrated Circuit Noise, Near Field Scanning, Near Fields, Plastic Molds, Resonance, Scanning, Standardized Methods, System Analysis",

author = "Giorgi Muchaidze and Huang Wei and Jin Min and Shao Peng and Drewniak, \{James L.\} and David Pommerenke",

year = "2008",

month = sep,

day = "1",

doi = "10.1109/EMCEUROPE.2008.4786897",

language = "American English",

journal = "Proceedings of the IEEE International Symposium on Electromagnetic Compatibility: EMC Europe (2008, Hamburg, Germany)",

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TY - JOUR

T1 - Automated Near-Field Scanning to Identify Resonances

AU - Muchaidze, Giorgi

AU - Wei, Huang

AU - Min, Jin

AU - Peng, Shao

AU - Drewniak, James L.

AU - Pommerenke, David

PY - 2008/9/1

Y1 - 2008/9/1

N2 - Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

AB - Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

KW - Cables

KW - Clocks

KW - Coupling Circuits

KW - Data Exchanges

KW - EMI

KW - ESD

KW - Electric Inverters

KW - Electromagnetic Compatibility

KW - Electromagnetic Interference

KW - Electromagnetic Pulse

KW - Electronic Systems

KW - Electrostatic Devices

KW - Electrostatic Discharge

KW - File Formats

KW - Frequency

KW - Immunity Analysis

KW - Immunity Testing

KW - Integrated Circuit Noise

KW - Near Field Scanning

KW - Near Fields

KW - Plastic Molds

KW - Resonance

KW - Scanning

KW - Standardized Methods

KW - System Analysis

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/904

U2 - 10.1109/EMCEUROPE.2008.4786897

DO - 10.1109/EMCEUROPE.2008.4786897

M3 - Article

JO - Proceedings of the IEEE International Symposium on Electromagnetic Compatibility: EMC Europe (2008, Hamburg, Germany)

JF - Proceedings of the IEEE International Symposium on Electromagnetic Compatibility: EMC Europe (2008, Hamburg, Germany)

ER -

Automated Near-Field Scanning to Identify Resonances

Abstract

Keywords

Disciplines

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