Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation

Kristen M. Donnell; R. Zoughi

doi:10.1109/IMTC.2011.5944194

Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.

Original language	American English
Journal	Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2011, Binjiang, Hangzhou, China)
DOIs	https://doi.org/10.1109/IMTC.2011.5944194
State	Published - May 1 2011

Keywords

Embedded Sensors
Loaded Scatterer
Materials Characterization
Microwave Nondestructive Testing
Modulated Scatterer
Directional Patterns (Antenna)
Elastic Constants
Instruments
Measurement Theory
Nondestructive Examination
Scattering
Embedded Sensor
Modulated Scatterer Technique

Disciplines

Electrical and Computer Engineering

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10.1109/IMTC.2011.5944194License: CC BY

https://doi.org/10.1109/IMTC.2011.5944194

Cite this

@article{4a8db545188e4b0b8b2a18b270ea61fd,

title = "Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation",

abstract = " Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.",

keywords = "Embedded Sensors, Loaded Scatterer, Materials Characterization, Microwave Nondestructive Testing, Modulated Scatterer, Directional Patterns (Antenna), Elastic Constants, Instruments, Measurement Theory, Nondestructive Examination, Scattering, Embedded Sensor, Modulated Scatterer Technique",

author = "Donnell, \{Kristen M.\} and R. Zoughi",

year = "2011",

month = may,

day = "1",

doi = "10.1109/IMTC.2011.5944194",

language = "American English",

journal = "Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2011, Binjiang, Hangzhou, China)",

}

TY - JOUR

T1 - Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation

AU - Donnell, Kristen M.

AU - Zoughi, R.

PY - 2011/5/1

Y1 - 2011/5/1

N2 - Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.

AB - Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.

KW - Embedded Sensors

KW - Loaded Scatterer

KW - Materials Characterization

KW - Microwave Nondestructive Testing

KW - Modulated Scatterer

KW - Directional Patterns (Antenna)

KW - Elastic Constants

KW - Instruments

KW - Measurement Theory

KW - Nondestructive Examination

KW - Scattering

KW - Embedded Sensor

KW - Modulated Scatterer Technique

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/2438

UR - https://doi.org/10.1109/IMTC.2011.5944194

U2 - 10.1109/IMTC.2011.5944194

DO - 10.1109/IMTC.2011.5944194

M3 - Article

JO - Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2011, Binjiang, Hangzhou, China)

JF - Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2011, Binjiang, Hangzhou, China)

ER -

Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation

Abstract

Keywords

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