@inproceedings{c35f4a010ebc4d6aae6e241a16f391e4,
title = "Aperture-Based FSS for Dielectric Thickness Sensing",
keywords = "Aperture-Based FSS, Frequency Selective Surface, FSS-Based Sensor, Thickness Sensing",
author = "Alexander Hook and Gage Donahue and Donnell, \{Kristen M.\}",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 2025 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2025 ; Conference date: 19-05-2025 Through 22-05-2025",
year = "2025",
doi = "10.1109/I2MTC62753.2025.11078943",
language = "English",
series = "Conference Record - IEEE Instrumentation and Measurement Technology Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2025 - Proceedings",
}