Analysis of via impedance variations with a Polynomial Chaos method

Jianxiang Shen; Hanfeng Wang; Ji Chen; Jun Fan

doi:10.1109/ISEMC.2011.6038436

Analysis of via impedance variations with a Polynomial Chaos method

Jianxiang Shen
, Hanfeng Wang
, Ji Chen
, Jun Fan

Electrical and Computer Engineering

University of Houston
Missouri University of Science and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	EMC 2011 - Proceedings
Subtitle of host publication	2011 IEEE International Symposium on Electromagnetic Compatibility
Pages	899-904
Number of pages	6
DOIs	https://doi.org/10.1109/ISEMC.2011.6038436
State	Published - 2011
Event	2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011 - Long Beach, CA, United States Duration: Aug 14 2011 → Aug 19 2011

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Conference

Conference	2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011
Country/Territory	United States
City	Long Beach, CA
Period	8/14/11 → 8/19/11

ASJC Scopus Subject Areas

Condensed Matter Physics
Electrical and Electronic Engineering

Keywords

Optimization
Polynomial chaos method
Sparse grid method
Statistical analysis
Via impedance

Access to Document

10.1109/ISEMC.2011.6038436

Cite this

Analysis of via impedance variations with a Polynomial Chaos method. / Shen, Jianxiang; Wang, Hanfeng; Chen, Ji et al.
EMC 2011 - Proceedings: 2011 IEEE International Symposium on Electromagnetic Compatibility. 2011. p. 899-904 6038436 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Shen, J, Wang, H, Chen, J & Fan, J 2011, Analysis of via impedance variations with a Polynomial Chaos method. in EMC 2011 - Proceedings: 2011 IEEE International Symposium on Electromagnetic Compatibility., 6038436, IEEE International Symposium on Electromagnetic Compatibility, pp. 899-904, 2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011, Long Beach, CA, United States, 8/14/11. https://doi.org/10.1109/ISEMC.2011.6038436

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title = "Analysis of via impedance variations with a Polynomial Chaos method",

keywords = "Optimization, Polynomial chaos method, Sparse grid method, Statistical analysis, Via impedance",

author = "Jianxiang Shen and Hanfeng Wang and Ji Chen and Jun Fan",

year = "2011",

doi = "10.1109/ISEMC.2011.6038436",

language = "English",

isbn = "9781424447831",

series = "IEEE International Symposium on Electromagnetic Compatibility",

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booktitle = "EMC 2011 - Proceedings",

note = "2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011 ; Conference date: 14-08-2011 Through 19-08-2011",

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AU - Shen, Jianxiang

AU - Wang, Hanfeng

AU - Chen, Ji

AU - Fan, Jun

PY - 2011

Y1 - 2011

KW - Optimization

KW - Polynomial chaos method

KW - Sparse grid method

KW - Statistical analysis

KW - Via impedance

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UR - https://www.scopus.com/pages/publications/80054765909#tab=citedBy

U2 - 10.1109/ISEMC.2011.6038436

DO - 10.1109/ISEMC.2011.6038436

M3 - Conference contribution

AN - SCOPUS:80054765909

SN - 9781424447831

T3 - IEEE International Symposium on Electromagnetic Compatibility

SP - 899

EP - 904

BT - EMC 2011 - Proceedings

T2 - 2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011

Y2 - 14 August 2011 through 19 August 2011

ER -

Analysis of via impedance variations with a Polynomial Chaos method

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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