Analysis of transit times and minority carrier mobility in n-p-n 4H-SiC bipolar junction transistors

Feng Zhao; Ivan Perez; Chih Fang Huang; John Torvik; Bart Van Zeghbroeck

doi:10.1109/TED.2005.859669

Analysis of transit times and minority carrier mobility in n-p-n 4H-SiC bipolar junction transistors

Feng Zhao
, Ivan Perez
, Chih Fang Huang
, John Torvik
, Bart Van Zeghbroeck

Microsemi Corporation
University of Colorado

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2541-2545
Number of pages	5
Journal	IEEE Transactions on Electron Devices
Volume	52
Issue number	12
DOIs	https://doi.org/10.1109/TED.2005.859669
State	Published - Dec 2005
Externally published	Yes

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Keywords

4H-SiC
Bipolar junction transistors (BJTs)
Minority carrier mobility
Transit frequency
Transit time

Access to Document

10.1109/TED.2005.859669

Cite this

@article{26eb49c0d6d848d6b52ae8e6aa71209a,

title = "Analysis of transit times and minority carrier mobility in n-p-n 4H-SiC bipolar junction transistors",

keywords = "4H-SiC, Bipolar junction transistors (BJTs), Minority carrier mobility, Transit frequency, Transit time",

author = "Feng Zhao and Ivan Perez and Huang, \{Chih Fang\} and John Torvik and \{Van Zeghbroeck\}, Bart",

year = "2005",

month = dec,

doi = "10.1109/TED.2005.859669",

language = "English",

volume = "52",

pages = "2541--2545",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

number = "12",

}

TY - JOUR

T1 - Analysis of transit times and minority carrier mobility in n-p-n 4H-SiC bipolar junction transistors

AU - Zhao, Feng

AU - Perez, Ivan

AU - Huang, Chih Fang

AU - Torvik, John

AU - Van Zeghbroeck, Bart

PY - 2005/12

Y1 - 2005/12

KW - 4H-SiC

KW - Bipolar junction transistors (BJTs)

KW - Minority carrier mobility

KW - Transit frequency

KW - Transit time

UR - https://www.scopus.com/pages/publications/29244451429

UR - https://www.scopus.com/pages/publications/29244451429#tab=citedBy

U2 - 10.1109/TED.2005.859669

DO - 10.1109/TED.2005.859669

M3 - Article

AN - SCOPUS:29244451429

SN - 0018-9383

VL - 52

SP - 2541

EP - 2545

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 12

ER -

Analysis of transit times and minority carrier mobility in n-p-n 4H-SiC bipolar junction transistors

ASJC Scopus Subject Areas

Keywords

Access to Document

Other files and links

Fingerprint

Cite this