Analysis of Chip-Level EMI using Near-Field Magnetic Scanning

Xiaopeng Dong; Shaowei Deng; Todd H. Hubing; Daryl G. Beetner

doi:10.1109/ISEMC.2004.1350020

Analysis of Chip-Level EMI using Near-Field Magnetic Scanning

Xiaopeng Dong
, Shaowei Deng
, Todd H. Hubing
, Daryl G. Beetner

Electrical and Computer Engineering

Missouri University of Science and Technology

Research output: Contribution to journal › Conference article › peer-review

Abstract

Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting in radiated emissions that are difficult or expensive to control. The paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs, including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems.

Original language	American English
Pages (from-to)	174-177
Number of pages	4
Journal	Proceedings of the 2004 International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA)
Volume	1
DOIs	https://doi.org/10.1109/ISEMC.2004.1350020
State	Published - Jan 1 2004
Event	2004 International Symposium on Electromagnetic Compatibility, EMC 2004 - Santa Clara, CA, United States Duration: Aug 9 2004 → Aug 13 2004

ASJC Scopus Subject Areas

Condensed Matter Physics
Electrical and Electronic Engineering

Keywords

Chip-Level EMI Analysis
Clock Driver
Current Distribution
Electric Current Measurement
Electric Noise Measurement
Electromagnetic Compatibility
Electromagnetic Interference
FPGA
Field Programmable Gate Array
High-Frequency Noise Currents
IC Packages
Integrated Circuit Noise
Integrated Circuit Testing
Integrated Circuits
Magnetic Field Measurement
Memory Module
Near-Field Magnetic Scanning
Printed Circuit Board
Radiated Emissions
Radiated Energy
Unintentional Radiating Structures

Disciplines

Electrical and Computer Engineering

Access to Document

10.1109/ISEMC.2004.1350020License: Unspecified

Analysis of Chip-Level EMI using Near-Field Magnetic ScanningFinal published version, 552 KBLicense: Unspecified

Cite this

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title = "Analysis of Chip-Level EMI using Near-Field Magnetic Scanning",

abstract = " Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting in radiated emissions that are difficult or expensive to control. The paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs, including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems.",

keywords = "Chip-Level EMI Analysis, Clock Driver, Current Distribution, Electric Current Measurement, Electric Noise Measurement, Electromagnetic Compatibility, Electromagnetic Interference, FPGA, Field Programmable Gate Array, High-Frequency Noise Currents, IC Packages, Integrated Circuit Noise, Integrated Circuit Testing, Integrated Circuits, Magnetic Field Measurement, Memory Module, Near-Field Magnetic Scanning, Printed Circuit Board, Radiated Emissions, Radiated Energy, Unintentional Radiating Structures",

author = "Xiaopeng Dong and Shaowei Deng and Hubing, \{Todd H.\} and Beetner, \{Daryl G.\}",

year = "2004",

month = jan,

day = "1",

doi = "10.1109/ISEMC.2004.1350020",

language = "American English",

volume = "1",

pages = "174--177",

journal = "Proceedings of the 2004 International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA)",

note = "2004 International Symposium on Electromagnetic Compatibility, EMC 2004 ; Conference date: 09-08-2004 Through 13-08-2004",

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TY - JOUR

T1 - Analysis of Chip-Level EMI using Near-Field Magnetic Scanning

AU - Dong, Xiaopeng

AU - Deng, Shaowei

AU - Hubing, Todd H.

AU - Beetner, Daryl G.

PY - 2004/1/1

Y1 - 2004/1/1

N2 - Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting in radiated emissions that are difficult or expensive to control. The paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs, including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems.

AB - Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting in radiated emissions that are difficult or expensive to control. The paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs, including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems.

KW - Chip-Level EMI Analysis

KW - Clock Driver

KW - Current Distribution

KW - Electric Current Measurement

KW - Electric Noise Measurement

KW - Electromagnetic Compatibility

KW - Electromagnetic Interference

KW - FPGA

KW - Field Programmable Gate Array

KW - High-Frequency Noise Currents

KW - IC Packages

KW - Integrated Circuit Noise

KW - Integrated Circuit Testing

KW - Integrated Circuits

KW - Magnetic Field Measurement

KW - Memory Module

KW - Near-Field Magnetic Scanning

KW - Printed Circuit Board

KW - Radiated Emissions

KW - Radiated Energy

KW - Unintentional Radiating Structures

UR - https://www.scopus.com/pages/publications/4644240555

UR - https://www.scopus.com/pages/publications/4644240555#tab=citedBy

U2 - 10.1109/ISEMC.2004.1350020

DO - 10.1109/ISEMC.2004.1350020

M3 - Conference article

VL - 1

SP - 174

EP - 177

JO - Proceedings of the 2004 International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA)

JF - Proceedings of the 2004 International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA)

T2 - 2004 International Symposium on Electromagnetic Compatibility, EMC 2004

Y2 - 9 August 2004 through 13 August 2004

ER -

Analysis of Chip-Level EMI using Near-Field Magnetic Scanning

Abstract

ASJC Scopus Subject Areas

Keywords

Disciplines

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