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Advanced On-chip SOL calibration method for unknown fixture de-embedding

  • Changwook Yoon
  • , Bichen Chen
  • , Xiaoning Ye
  • , Jun Fan

Research output: Contribution to journal › Article › peer-review

Original languageEnglish
Pages (from-to)543-551
Number of pages9
JournalJournal of Semiconductor Technology and Science
Volume17
Issue number4
DOIs
StatePublished - Aug 2017

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Keywords

  • De-embedding
  • Iterative error sensitivity
  • SOL calibration

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