@article{7f0ce71be4b649d0bda963aa235ca840,
title = "Advanced On-chip SOL calibration method for unknown fixture de-embedding",
keywords = "De-embedding, Iterative error sensitivity, SOL calibration",
author = "Changwook Yoon and Bichen Chen and Xiaoning Ye and Jun Fan",
note = "Publisher Copyright: {\textcopyright} 2017, Institute of Electronics Engineers of Korea. All rights reserved.",
year = "2017",
month = aug,
doi = "10.5573/JSTS.2017.17.4.543",
language = "English",
volume = "17",
pages = "543--551",
journal = "Journal of Semiconductor Technology and Science",
issn = "1598-1657",
number = "4",
}