A stochastic model for dielectric breakdown in thin capacitors

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@article{a493ad0fcf56496fa395a853c64a7c9e,

title = "A stochastic model for dielectric breakdown in thin capacitors",

author = "Willming, \{D. A.\} and Cheng-Hsiao Wu",

year = "1988",

doi = "10.1063/1.340263",

language = "English",

volume = "63",

pages = "456--459",

journal = "Journal of Applied Physics",

issn = "0021-8979",

number = "2",

}

TY - JOUR

T1 - A stochastic model for dielectric breakdown in thin capacitors

AU - Willming, D. A.

AU - Wu, Cheng-Hsiao

PY - 1988

Y1 - 1988

UR - https://www.scopus.com/pages/publications/0005547979

UR - https://www.scopus.com/pages/publications/0005547979#tab=citedBy

U2 - 10.1063/1.340263

DO - 10.1063/1.340263

M3 - Article

SN - 0021-8979

VL - 63

SP - 456

EP - 459

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 2

ER -