Abstract
In this paper, a stabilized second order in time accurate linear exponential time differencing (ETD) scheme for the no-slope-selection thin film growth model is presented. an artificial stabilizing term $ A{\tau}^2\frac{\mathrm{\partial}{\Delta}^2u}{\mathrm{\partial}t}$ is added to the physical model to achieve energy stability, with ETD-Based multi-step approximations and Fourier collocation spectral method applied in the time integral and spatial discretization of the evolution equation, respectively. Long time energy stability and detailed o ∞(0,T;o 2) error analysis are provided based on the energy method, with a careful estimate of the aliasing error. in addition, numerical experiments are presented to demonstrate the energy decay and convergence rate.
| Original language | American English |
|---|---|
| Pages (from-to) | 727-750 |
| Number of pages | 24 |
| Journal | ESAIM: Mathematical Modelling and Numerical Analysis |
| Volume | 54 |
| Issue number | 3 |
| DOIs | |
| State | Published - May 1 2020 |
Keywords
- Convergence Analysis
- Epitaxial Thin Film Growth
- Exponential Time Differencing
- Long Time Energy Stability
- Second Order Scheme
Disciplines
- Mathematics
- Statistics and Probability
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