A dual-current-probe method for characterizing common-mode loop impedance

Geping Liu; Yimin Ding; Chingchi Chen; Richard Kautz; James L. Drewniak; David J. Pommerenke; Marina Y. Koledintseva

A dual-current-probe method for characterizing common-mode loop impedance

Geping Liu
, Yimin Ding
, Chingchi Chen
, Richard Kautz
, James L. Drewniak
, David J. Pommerenke
, Marina Y. Koledintseva

Electrical and Computer Engineering

Missouri University of Science and Technology
Motorola
Ford Motor Company

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	1239-1244
Number of pages	6
State	Published - 2003
Event	Proceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States Duration: May 20 2003 → May 22 2003

Conference

Conference	Proceedings of the 20th IEEE Information and Measurement Technology Conference
Country/Territory	United States
City	Vail, CO
Period	5/20/03 → 5/22/03

ASJC Scopus Subject Areas

Electrical and Electronic Engineering

Cite this

@conference{f0ed56d71be7405e8bfc98153e0d8347,

title = "A dual-current-probe method for characterizing common-mode loop impedance",

author = "Geping Liu and Yimin Ding and Chingchi Chen and Richard Kautz and Drewniak, \{James L.\} and Pommerenke, \{David J.\} and Koledintseva, \{Marina Y.\}",

year = "2003",

language = "English",

pages = "1239--1244",

note = "Proceedings of the 20th IEEE Information and Measurement Technology Conference ; Conference date: 20-05-2003 Through 22-05-2003",

}

TY - CONF

T1 - A dual-current-probe method for characterizing common-mode loop impedance

AU - Liu, Geping

AU - Ding, Yimin

AU - Chen, Chingchi

AU - Kautz, Richard

AU - Drewniak, James L.

AU - Pommerenke, David J.

AU - Koledintseva, Marina Y.

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0037484124

UR - https://www.scopus.com/pages/publications/0037484124#tab=citedBy

M3 - Paper

AN - SCOPUS:0037484124

SP - 1239

EP - 1244

T2 - Proceedings of the 20th IEEE Information and Measurement Technology Conference

Y2 - 20 May 2003 through 22 May 2003

ER -

A dual-current-probe method for characterizing common-mode loop impedance

Conference

ASJC Scopus Subject Areas

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Cite this