A contactless method for measuring the bulk resistance of II-VI compound semiconductors

Edward D. Wheeler; Jack L. Boone; James L. Drewniak

doi:10.1063/1.1145175

A contactless method for measuring the bulk resistance of II-VI compound semiconductors

Edward D. Wheeler
, Jack L. Boone
, James L. Drewniak

Electrical and Computer Engineering

Missouri University of Science and Technology

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	3844-3847
Number of pages	4
Journal	Review of Scientific Instruments
Volume	65
Issue number	12
DOIs	https://doi.org/10.1063/1.1145175
State	Published - 1994

ASJC Scopus Subject Areas

Instrumentation

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title = "A contactless method for measuring the bulk resistance of II-VI compound semiconductors",

author = "Wheeler, \{Edward D.\} and Boone, \{Jack L.\} and Drewniak, \{James L.\}",

year = "1994",

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pages = "3844--3847",

journal = "Review of Scientific Instruments",

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AU - Wheeler, Edward D.

AU - Boone, Jack L.

AU - Drewniak, James L.

PY - 1994

Y1 - 1994

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SN - 0034-6748

VL - 65

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EP - 3847

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 12

ER -

A contactless method for measuring the bulk resistance of II-VI compound semiconductors

ASJC Scopus Subject Areas

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