A 20 GHz Landing Probe Design based on Pogo-Pins

Xin Yan; Yansheng Wang; Jianchi Zhou; Tun Li; Jun Fan

doi:10.1109/EMCSI.2018.8495397

A 20 GHz Landing Probe Design based on Pogo-Pins

Xin Yan
, Yansheng Wang
, Jianchi Zhou
, Tun Li
, Jun Fan

Research output: Contribution to journal › Article › peer-review

Abstract

A landing probe design is proposed in this paper based on pogo-pins. Landing probes are usually used to obtain TDR and S-parameters of the device under test (DUT) so that the performance of the DUT can be evaluated. This design has two major advantages. First, it is durable. Second, it can be easily integrated into automated testing systems. The designed probe works well up to 20 GHz, which is validated by measurement.

Original language	American English
Journal	Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA)
DOIs	https://doi.org/10.1109/EMCSI.2018.8495397
State	Published - Jul 1 2018

Keywords

Automated testing
Busbars
Design for testability
Device under test
Electromagnetic compatibility
Landing
Landing pads
Pogo-pin
Probe design
Probes
Scattering parameters
Signal Integrity (SI)

Disciplines

Electrical and Computer Engineering

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10.1109/EMCSI.2018.8495397License: Unspecified

https://doi.org/10.1109/EMCSI.2018.8495397

Cite this

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title = "A 20 GHz Landing Probe Design based on Pogo-Pins",

abstract = " A landing probe design is proposed in this paper based on pogo-pins. Landing probes are usually used to obtain TDR and S-parameters of the device under test (DUT) so that the performance of the DUT can be evaluated. This design has two major advantages. First, it is durable. Second, it can be easily integrated into automated testing systems. The designed probe works well up to 20 GHz, which is validated by measurement.",

keywords = "Automated testing, Busbars, Design for testability, Device under test, Electromagnetic compatibility, Landing, Landing pads, Pogo-pin, Probe design, Probes, Scattering parameters, Signal Integrity (SI)",

author = "Xin Yan and Yansheng Wang and Jianchi Zhou and Tun Li and Jun Fan",

year = "2018",

month = jul,

day = "1",

doi = "10.1109/EMCSI.2018.8495397",

language = "American English",

journal = "Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA)",

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AU - Yan, Xin

AU - Wang, Yansheng

AU - Zhou, Jianchi

AU - Li, Tun

AU - Fan, Jun

PY - 2018/7/1

Y1 - 2018/7/1

N2 - A landing probe design is proposed in this paper based on pogo-pins. Landing probes are usually used to obtain TDR and S-parameters of the device under test (DUT) so that the performance of the DUT can be evaluated. This design has two major advantages. First, it is durable. Second, it can be easily integrated into automated testing systems. The designed probe works well up to 20 GHz, which is validated by measurement.

AB - A landing probe design is proposed in this paper based on pogo-pins. Landing probes are usually used to obtain TDR and S-parameters of the device under test (DUT) so that the performance of the DUT can be evaluated. This design has two major advantages. First, it is durable. Second, it can be easily integrated into automated testing systems. The designed probe works well up to 20 GHz, which is validated by measurement.

KW - Automated testing

KW - Busbars

KW - Design for testability

KW - Device under test

KW - Electromagnetic compatibility

KW - Landing

KW - Landing pads

KW - Pogo-pin

KW - Probe design

KW - Probes

KW - Scattering parameters

KW - Signal Integrity (SI)

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DO - 10.1109/EMCSI.2018.8495397

M3 - Article

JO - Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA)

JF - Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA)

ER -

A 20 GHz Landing Probe Design based on Pogo-Pins

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Keywords

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