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US Patent Issued to GENERAL TEST SYSTEMS on Jan. 16 for "Radio frequency performance testing method and apparatus of wireless device, and tester" (Chinese Inventors)

  • Yihong Qi

Press/Media: Research

PeriodJan 17 2024

Media coverage

1

Media coverage

  • TitleUS Patent Issued to GENERAL TEST SYSTEMS on Jan. 16 for "Radio frequency performance testing method and apparatus of wireless device, and tester" (Chinese Inventors)
    Media name/outletUS Fed News
    Country/TerritoryUnited States
    Date1/17/24
    PersonsYihong Qi
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