Researchers at National Tsing Hua University Release New Data on Science (Endurance Paradox in Hafnium-Oxide-Based Silicon-Channel Ferroelectric Transistors)

Media coverage

• Title	Researchers at National Tsing Hua University Release New Data on Science (Endurance Paradox in Hafnium-Oxide-Based Silicon-Channel Ferroelectric Transistors)
  Media name/outlet	Taiwan Daily Report
  Country/Territory	United States
  Date	5/18/26
  Persons	Feng Zhao