Findings in Electronics Reported from Xiamen University (Localized Anodic Etching Rates of Iii-v Semiconductors Through Scanning Electrochemical Probe Lithography)

Media coverage

• Title	Findings in Electronics Reported from Xiamen University (Localized Anodic Etching Rates of Iii-v Semiconductors Through Scanning Electrochemical Probe Lithography)
  Media name/outlet	Electronics Daily
  Country/Territory	United States
  Date	9/24/25
  Persons	Jian Liu